Scanning electron microscopy (in preparation)

Experiment No. XX - Scanning electron microscopy
Fortgeschrittenenpraktikum der Technischen Universität München am Max-Planck-Institut für Plasmaphysik


Scanning electron microscopy is a widely used method for investigation of different kinds of samples. It is a very common method in many research fields as well as in the industry. In this lab experiment the students will learn to operate a scanning electron microscope. After the course the students will understand the different image modes in a scanning electron microscope and will be able to make images and to interpret them. The student will take images with the secondary electron signal as well as with the backscattered electrons. Energy dispersive X-ray spectrometry on samples will be executed as well to find out their chemical composition. The students can also bring along their own sample. The experiment is carried out at the Max Planck Institut für Plasmaphysik IPP in Garching.



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