Publications of H. Liebl
All genres
Journal Article (44)
2007
Journal Article
78, 083903 (2007)
Inverse photoemission with energy resolution better than 200 meV. Review of Scientific Instruments 1991
Journal Article
36, pp. 91 - 98 (1991)
Low-Energy Electron Microscope of Novel Design. Ultramicroscopy 1990
Journal Article
85, 2, p. 87 (1990)
On the Image Aberration of an Accelerating Central Field. Optik 1989
Journal Article
11, pp. 101 - 151 (1989)
Ion Probe Microscopy. Advances in Optical and Electron Microscopy
Journal Article
83, 4, pp. 129 - 133 (1989)
The Image Aberration Caused by the Acceleration Field Between Concentric Spherical Electrodes. Optik 1988
Journal Article
59, 9, pp. 1933 - 1940 (1988)
High-Performance GaAs Polarized Electron Source for Use in Inverse Photoemission Spectroscopy. Review of Scientific Instruments
Journal Article
Bd. 80, Nr. 1, pp. 4 - 8 (1988)
On the Image Aberration of the Uniform Acceleration Field of an Emission Lens. Optik
Journal Article
59, 10, pp. 2174 - 2176 (1988)
Cs_exp.+ Ion Microsource. Review of Scientific Instruments 1987
Journal Article
258, pp. 323 - 326 (1987)
A Compact Double-Focusing Mass Spectrometer. Nuclear Instruments and Methdos in Physics Research. A
Journal Article
76, 4, pp. 170 - 172 (1987)
Transfer Matrix for the Trajectories of Charged Particles Between Concentric, Spherical, Equipotential Surfaces. Optik
Journal Article
58, 10, pp. 1830 - 1832 (1987)
Deceleration Ion Optical Systems for Sputtering Measurements between 50 eV as Function of Angle of Incidence. Review of Scientific Instruments 1986
Journal Article
3, pp. 793 - 798 (1986)
Ion Optics of Submicron Ion Beams. Scanning Electron Microscopy 1984
Journal Article
11, p. 519 (1984)
High-Resolution Scanning Ion Microscopy and Secondary-Ion Mass Spectrometry: Problems and Solutions. Scanning Electron Microscopy 1983
Journal Article
46, p. 511 (1983)
Combined Electrostatic Objective and Emission Lenses for Microcharacterization of Surfaces. International Journal of Mass Spectrometry and Ion Physics
Journal Article
33, p. 525 (1983)
Ion Optics of Ion Microprobe Instruments. Vacuum
Journal Article
314, p. 244 (1983)
Grenzen der Ortsaufloesung bei SIMS. Fresenius Zeitschrift fuer Analytische Chemie 1981
Journal Article
58, p. 433 (1981)
Comment on ' An Analysis of Some Solution Techniques for Electrostatic Coaxial Lenses '. Optik
Journal Article
187, p. 143 (1981)
Beam Optics in Secondary Ion Mass Spectrometry. Nuclear Instruments and Methods in Physics Research
Journal Article
191, p. 183 (1981)
Optimum Sample Utilization in Secondary Ion Mass Spectrometry. Nuclear Instruments and Methods in Physics Research 1980
Journal Article
3, p. 79 (1980)
SIMS Instrumentation and Imaging Techniques. Scanning