Publications of H LIEBL

Journal Article (44)

41.
Journal Article
LIEBL, H.: COAXIAL COMBINED ELECTROSTATIC OBJECTIVE AND ANODE LENS FOR MICROPROBE MASS ANALYZERS. VACUUM 22 (11), pp. 619 - 621 (1972)
42.
Journal Article
Rasskopf, K.; Liebl, H.; Blauth, E.W.: Double Chamber Partial Pressure Gauge. Journal of Vacuum Science and Technology 9, 1, pp. 492 - 495 (1972)
43.
Journal Article
Liebl, H.: Design of a Combined Ion and Electron Microprobe Apparatus. International Journal of Mass Spectrometry and Ion Physics 6, pp. 401 - 412 (1971)
44.
Journal Article
Blauth, E.W.; Draeger, W.M.; Kirschner, J.; Liebl, H.; Mueller, N.; Taglauer, E.: Experimental and Statistical Investigations on the Measurement of very Low Ion Currents in Mass Spectrometers. Journal of Vacuum Science and Technology 8, pp. 384 - 387 (1970)

Book Chapter (4)

45.
Book Chapter
Liebl, H.; Benninghoven, A.: Ion Gun Systems for Submicron SIMS. In: Secondary Ion Mass Spectrometry SIMS IV, p. 114 (1984)
46.
Book Chapter
Hofer, W.O.; Meyer, O.; Liebl, H.: Sputtering of Thin Films in an Ion Microprobe. In: Ion Beam Surface Layer Analysis, Vol. Vol. 2, pp. 659 - 664 (1976)
47.
Book Chapter
Liebl, H.: The Ion Microprobe-Instrumentation and Techniques. In: Secondary Ion Mass Spectrometry, Vol. Bd. 427, p. 1 (1975)
48.
Book Chapter
Liebl, H.; Gross, J.F.: The Ion Microprobe. In: Modern Techniques in Physiological Sciences, pp. 361 - 378 (1973)

Conference Paper (9)

49.
Conference Paper
Liebl, H.; Senftinger, B.: Low-Energy Electron Microscope of Novel Design. In: Proc. of the 12. International Congress for Electron Microscopy, pp. 352 - 353. Proc. of the 12. International Congress for Electron Microscopy, Seattle, WA(US), January 01, 1990. San Francisco Press Inc. (1990)
50.
Conference Paper
Liebl, H.; Senftinger, P.; Staib, P.; Weiss, H.: Compact Cs+ Ion Microsource. In: Secondary Ion Mass Spectrometry. Proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry, pp. 883 - 886 (Ed. Benninghoven, A.). 7th Secondary Ion Mass Spectrometry (SIMDVII), Monterey, CA (US), September 03, 1989 - September 08, 1989. Wiley, Chichester (1990)
51.
Conference Paper
Senftinger, B.; Liebl, H.: Performance Evaluation of a Novel Type of Low-Energy Electron Microscope. In: Proc. of the 12. International Congress for Electron Microscopy, pp. 354 - 355. Proc. of the 12. International Congress for Electron Microscopy, Seattle, WA(US), January 01, 1990. San Francisco Press Inc. (1990)
52.
Conference Paper
Liebl, H.; Weiss, H.: On a Combined Electrostatic Objective and Emission Lens for Charged Particle of Oposite or Equal Polarity: International Symposium. In: Electron Optics, pp. 154 - 161. Electron Optics, Beijing (CN), January 01, 1987. (1987)
53.
Conference Paper
Liebl, H.: New Trends in Instrumentation. In: Secondary Ion Mass Spectrometry, pp. 205 - 210. Secondary Ion Mass Spectrometry, Osaka (JP), October 22, 1978 - October 28, 1978. (1979)
54.
Conference Paper
Hofer, W.O.; Liebl, H.; Staudenmaier, G.: Depth Analysis of Thin Films with an Ion Microprobe. In: 148. Meeting of the Electrochemical Society, p. 243. 148. Meeting of the Electrochemical Society, Princeton, NJ(US), October 05, 1975 - October 10, 1975. (1975)
55.
Conference Paper
Liebl, H.: Neue Tendenzen in der Geraeteentwicklung von Ionensonden und Elektronensonden. In: Mikrosonde, pp. 189 - 198. Mikrosonde, Berlin (DE). (1975)
56.
Conference Paper
Liebl, H.: A Combined Ion and Electron Microprobe. In: Mass Spectrometry, pp. 433 - 435. Mass Spectrometry, Brussel (BE). (1970)
57.
Conference Paper
Liebl, H.: Mattauch-Herzog-Type Mass Spectrographs with Independent Adjustment of Aperture and Energy Bandwidth. In: Mass Spectrography, pp. 188 - 193. Mass Spectrography, Kyoto (JP), September 08, 1969 - September 12, 1969. (1969)

Report (1)

58.
Report
Bentz, B. L.; Weiß, H.; Liebl, H.: Cs+ ion source for secondary ion mass spectrometry. Max-Planck-Institut für Plasmaphysik, Garching (1981)
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