Publications of W. Heiland

Taglauer, E.; Heiland, W.: Surface Analysis with Low Energy Ion Scattering. Applied Physics 9, pp. 261 - 275 (1976)

Heiland, W.: The Structure of Metal-Vacuum Interface. Modern Aspects of Electrochemistry 11, pp. 85 - 139 (1975)

Heiland, W.; Iberl, F.; Taglauer, E.: Oxygen Adsorption on 110_Silver. Surface Science 53, pp. 383 - 392 (1975)

Heiland, W.; Taglauer, E.: Abstract: Surface Analytical Studies Using Ion Scattering Spectrometry, Auger Electron Spectroscopy and Secondary Ion Mass Spectrometry. The Journal of Vacuum Science and Technology 12, p. 352 (1975)

Taglauer, E.; Heiland, W.: Low Energy Ion Scattering and Auger Electron Spectroscopy Studies of Clean Nickel Surfaces and Absorbed Layers. Surface Science 47, pp. 234 - 243 (1975)

Taglauer, E.; Melchior, W.; Schuster, F.; Heiland, W.: SORBAS: Eine Apparatur zur Untersuchung der Oberflaechenstreuung von Ionen im Energiebereich 100_eV - 2000_eV. Journal of Physics. E 8, pp. 768 - 772 (1975)

Grundner, M.; Heiland, W.; Taglauer, E.: Direct Comparison of Ion Scattering and Secondary Ion Emission as Tools for Analysis of Metal Surfaces. Applied Physics 4, pp. 243 - 248 (1974)

Taglauer, E.; Heiland, W.: Direct Comparison of Low-Energy Ion Backscattering with Auger Electron Spectroscopy in the Analysis of S Adsorbed on Ni. Applied Physics Letters 24, pp. 437 - 439 (1974)

Heiland, W.: Some Aspects of Ion Scattering and Surface Analysis. Vakuum-Technik Jg. 22, 6, pp. 187 - 188 (1973)

Heiland, W.; Schaeffler, H.G.; Taglauer, E.: Energy Distributions of Low-Energy Noble Gas Ions Backscattered from a Single-Crystal Nickel Surface. Surface Science 35, pp. 381 - 392 (1972)

Heiland, W.; Taglauer, E.: Investigation of Surface Topography of Oxygen on Nickel Single Crystals by Helium Ion Backscattering. Journal of Vacuum Science and Technology 251, pp. 620 - 623 (1972)

Mueller, N.; Eckstein, W.; Heiland, W.: Electron Spin Polarization in Field Emission from EuS-Coated Tungsten Tips. Part_2. Physical Review Letters 29, 25, pp. 1651 - 1654 (1972)

Mueller, N.; Eckstein, W.; Heiland, W.; Zinn, W.: Electron Spin Polarization in Field Emission from EuS-Coated Tungsten Tips. Part_1. Physical Review Letters 29, 25, pp. 365 - 370 (1972)

Taglauer, E.; Heiland, W.: Investigation of the Chain Effect in the Scattering of Low Energy Noble Gas Ions from a Ni(110) Surface. Surface Science 33, pp. 27 - 34 (1972)

Taglauer, E.; Heiland, W.: Multiple Scattering of Low Energy Noble Gas Ions from a Nickel Single Crystal Surface. The Journal of Vacuum Science and Technology 9, p. 623 (1972)

Heiland, W.: Die Technologie kommender Fusionsreaktoren. Atomwirtschaft 16, p. 52 (1971)

Blauth, E.W.; Schaeffler, H.G.; Heiland, W.: An Ionization Gauge for the Pressure Range 10_exp.-5_Torr to 10_Torr. Zeitschrift fuer angewandte Physik Bd. 29, 1, pp. 70 - 73 (1970)

Eckstein, W.; Georg, K.F.; Heiland, W.; Kirschner, J.; Mueller, N.: On the Field Emission from Ni, Gd, and EuS Evaporated on to Tungsten. Zeitschrift fuer Naturforschung. A 25, pp. 1981 - 1982 (1970)

Taglauer, E.; Heiland, W.: Inelastic Particle-Surface Collisions. Springer, Berlin (1981)

Taglauer, E.; Frey, H.; Heiland, W.; Kienel, K.: Physikalische Grundlagen moderner Methoden der Oberflaechenanalyse. In: Duennschichttechnologie, pp. 314 - 339 (1987)