Publications of H LIEBL
All genres
Journal Article (44)
41.
Journal Article
22 (11), pp. 619 - 621 (1972)
COAXIAL COMBINED ELECTROSTATIC OBJECTIVE AND ANODE LENS FOR MICROPROBE MASS ANALYZERS. VACUUM 42.
Journal Article
9, 1, pp. 492 - 495 (1972)
Double Chamber Partial Pressure Gauge. Journal of Vacuum Science and Technology 43.
Journal Article
6, pp. 401 - 412 (1971)
Design of a Combined Ion and Electron Microprobe Apparatus. International Journal of Mass Spectrometry and Ion Physics 44.
Journal Article
8, pp. 384 - 387 (1970)
Experimental and Statistical Investigations on the Measurement of very Low Ion Currents in Mass Spectrometers. Journal of Vacuum Science and Technology Book Chapter (4)
45.
Book Chapter
Ion Gun Systems for Submicron SIMS. In: Secondary Ion Mass Spectrometry SIMS IV, p. 114 (1984)
46.
Book Chapter
Vol. 2, pp. 659 - 664 (1976)
Sputtering of Thin Films in an Ion Microprobe. In: Ion Beam Surface Layer Analysis, Vol. 47.
Book Chapter
Bd. 427, p. 1 (1975)
The Ion Microprobe-Instrumentation and Techniques. In: Secondary Ion Mass Spectrometry, Vol. 48.
Book Chapter
The Ion Microprobe. In: Modern Techniques in Physiological Sciences, pp. 361 - 378 (1973)
Conference Paper (9)
49.
Conference Paper
Low-Energy Electron Microscope of Novel Design. In: Proc. of the 12. International Congress for Electron Microscopy, pp. 352 - 353. Proc. of the 12. International Congress for Electron Microscopy, Seattle, WA(US), January 01, 1990. San Francisco Press Inc. (1990)
50.
Conference Paper
Compact Cs+ Ion Microsource. In: Secondary Ion Mass Spectrometry. Proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry, pp. 883 - 886 (Ed. Benninghoven, A.). 7th Secondary Ion Mass Spectrometry (SIMDVII), Monterey, CA (US), September 03, 1989 - September 08, 1989. Wiley, Chichester (1990)
51.
Conference Paper
Performance Evaluation of a Novel Type of Low-Energy Electron Microscope. In: Proc. of the 12. International Congress for Electron Microscopy, pp. 354 - 355. Proc. of the 12. International Congress for Electron Microscopy, Seattle, WA(US), January 01, 1990. San Francisco Press Inc. (1990)
52.
Conference Paper
On a Combined Electrostatic Objective and Emission Lens for Charged Particle of Oposite or Equal Polarity: International Symposium. In: Electron Optics, pp. 154 - 161. Electron Optics, Beijing (CN), January 01, 1987. (1987)
53.
Conference Paper
New Trends in Instrumentation. In: Secondary Ion Mass Spectrometry, pp. 205 - 210. Secondary Ion Mass Spectrometry, Osaka (JP), October 22, 1978 - October 28, 1978. (1979)
54.
Conference Paper
Depth Analysis of Thin Films with an Ion Microprobe. In: 148. Meeting of the Electrochemical Society, p. 243. 148. Meeting of the Electrochemical Society, Princeton, NJ(US), October 05, 1975 - October 10, 1975. (1975)
55.
Conference Paper
Neue Tendenzen in der Geraeteentwicklung von Ionensonden und Elektronensonden. In: Mikrosonde, pp. 189 - 198. Mikrosonde, Berlin (DE). (1975)
56.
Conference Paper
A Combined Ion and Electron Microprobe. In: Mass Spectrometry, pp. 433 - 435. Mass Spectrometry, Brussel (BE). (1970)
57.
Conference Paper
Mattauch-Herzog-Type Mass Spectrographs with Independent Adjustment of Aperture and Energy Bandwidth. In: Mass Spectrography, pp. 188 - 193. Mass Spectrography, Kyoto (JP), September 08, 1969 - September 12, 1969. (1969)
Report (1)
58.
Report
Cs+ ion source for secondary ion mass spectrometry. Max-Planck-Institut für Plasmaphysik, Garching (1981)