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Journal Article (44)

1.
Journal Article
Budke, M.; Renken, V.; Liebl, H.; Rangelov, G.; Donath, M.: Inverse photoemission with energy resolution better than 200 meV. Review of Scientific Instruments 78, 083903 (2007)
2.
Journal Article
Liebl, H.; Senftinger, B.: Low-Energy Electron Microscope of Novel Design. Ultramicroscopy 36, pp. 91 - 98 (1991)
3.
Journal Article
Liebl, H.: On the Image Aberration of an Accelerating Central Field. Optik 85, 2, p. 87 (1990)
4.
Journal Article
Liebl, H.: Ion Probe Microscopy. Advances in Optical and Electron Microscopy 11, pp. 101 - 151 (1989)
5.
Journal Article
Liebl, H.: The Image Aberration Caused by the Acceleration Field Between Concentric Spherical Electrodes. Optik 83, 4, pp. 129 - 133 (1989)
6.
Journal Article
Kolac, U.; Donath, M.; Ertl, K.; Liebl, H.; Dose, V.: High-Performance GaAs Polarized Electron Source for Use in Inverse Photoemission Spectroscopy. Review of Scientific Instruments 59, 9, pp. 1933 - 1940 (1988)
7.
Journal Article
Liebl, H.: On the Image Aberration of the Uniform Acceleration Field of an Emission Lens. Optik Bd. 80, Nr. 1, pp. 4 - 8 (1988)
8.
Journal Article
Liebl, H.; Senftinger, B.: Cs_exp.+ Ion Microsource. Review of Scientific Instruments 59, 10, pp. 2174 - 2176 (1988)
9.
Journal Article
Liebl, H.: A Compact Double-Focusing Mass Spectrometer. Nuclear Instruments and Methdos in Physics Research. A 258, pp. 323 - 326 (1987)
10.
Journal Article
Liebl, H.: Transfer Matrix for the Trajectories of Charged Particles Between Concentric, Spherical, Equipotential Surfaces. Optik 76, 4, pp. 170 - 172 (1987)
11.
Journal Article
Liebl, H.; Bohdansky, J.; Roth, J.; Dose, V.: Deceleration Ion Optical Systems for Sputtering Measurements between 50 eV as Function of Angle of Incidence. Review of Scientific Instruments 58, 10, pp. 1830 - 1832 (1987)
12.
Journal Article
Liebl, H.: Ion Optics of Submicron Ion Beams. Scanning Electron Microscopy 3, pp. 793 - 798 (1986)
13.
Journal Article
Liebl, H.: High-Resolution Scanning Ion Microscopy and Secondary-Ion Mass Spectrometry: Problems and Solutions. Scanning Electron Microscopy 11, p. 519 (1984)
14.
Journal Article
Liebl, H.: Combined Electrostatic Objective and Emission Lenses for Microcharacterization of Surfaces. International Journal of Mass Spectrometry and Ion Physics 46, p. 511 (1983)
15.
Journal Article
Liebl, H.: Ion Optics of Ion Microprobe Instruments. Vacuum 33, p. 525 (1983)
16.
Journal Article
Liebl, H.: Grenzen der Ortsaufloesung bei SIMS. Fresenius Zeitschrift fuer Analytische Chemie 314, p. 244 (1983)
17.
Journal Article
Liebl, H.: Comment on ' An Analysis of Some Solution Techniques for Electrostatic Coaxial Lenses '. Optik 58, p. 433 (1981)
18.
Journal Article
Liebl, H.: Beam Optics in Secondary Ion Mass Spectrometry. Nuclear Instruments and Methods in Physics Research 187, p. 143 (1981)
19.
Journal Article
Liebl, H.: Optimum Sample Utilization in Secondary Ion Mass Spectrometry. Nuclear Instruments and Methods in Physics Research 191, p. 183 (1981)
20.
Journal Article
Liebl, H.: SIMS Instrumentation and Imaging Techniques. Scanning 3, p. 79 (1980)
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