Publikationen von V. K. Alimov

Poster (26)

101.
Poster
Tyburska, B.; Ogorodnikova, O. V.; Schmid, K.; Alimov, V. K.; Ertl, K.: Ion-driven deuterium retention in self-damaged tungsten. 12th International Workshop on Plasma-Facing Materials and Components for Fusion Applications (PFMC-12), Jülich (2009)
102.
Poster
Goncharov, V. L.; Lakhotkin, Y. V.; Kuzmin, V. P.; Alimov, V.; Roth, J.: Chemical Vapor Crystallization of Hard Nanocomposite Tungsten Carbide Layers for Extreme Applications. 1st International Conference on New Materials for Extreme Environments (ExtreMat), San Sebastian (2008)
103.
Poster
Gusev, V. K.; Alimov, V. K.; Arkhipov, I. I.; Balden, M.; Denisov, E. A.; Gorodetsky, A. E.; Kurdumov, A. A.; Kompaniec, T. N.; Lebedev, V. M.; Litunovstkii, N. V. et al.; Mazul, I. V.; Novokhatsky, A. N.; Petrov, Y. V.; Sakharov, N. V.; Sharapov, V. M.; Terukov, E. I.; Trapeznikova, I. N.; Roth, J.; Zakharov, A. P.; Zalavutdinov, R. K.: Recrystallized RGTi Graphite Application as the First Wall Material in Globus-M Spherical Tokamak. 13th International Conference on Fusion Reactor Materials (ICFRM-13), Nice (2007)
104.
Poster
Lindig, S.; Balden, M.; Maier, H.; Roth, J.; Mayer, M.; Krieger, K.; Laux, M.; Likonen, J.; Coad, J.; Philipps, V. et al.; Alimov, V.; Doerner, R.; Baldwin, M.; ASDEX Upgrade Team; JET-EFDA Contributors: Clarification of plasma-surface interaction mechanisms by SEM. 11th International Workshop on Plasma-Facing Materials and Components for Fusion Applications (PFMC-11), Greifswald (2006)
105.
Poster
Hayashi, T.; Sugiyama, K.; Krieger, K.; Mayer, M.; Alimov, V.; Tanabe, T.; Masaki, K.; Miya, N.: Deuterium depth profiling in JT-60U tiles using the D3(He,p)4He resonant nuclear reaction. 17th International Conference of Plasma Surface Interactions in Controlled Fusion Devices (PSI 17), Hefei Anhui (2006)
106.
Poster
Alimov, V. K.; Roth, J.: Depth distribution of deuterium in tungsten up to depths of several micrometers. 16th International Conference on Plasma Surface Interactions in Controlled Fusion Devices (PSI 16), Portland, Maine (2004)
Zur Redakteursansicht