Publikationen von H. Liebl
Alle Typen
Zeitschriftenartikel (44)
21.
Zeitschriftenartikel
53, 4, S. 333 - 338 (1979)
An Electrostatic Radial Field Doublet Lens. Optik 22.
Zeitschriftenartikel
53, 1, S. 69 - 72 (1979)
A New Emission Lens. Optik 23.
Zeitschriftenartikel
1, 3/4, S. 241 - 259 (1978)
Mass Spectrometry of Solids - With Special Emphasis on Probe Sampling. Mikrochimica Acta 24.
Zeitschriftenartikel
38, S. 266 - 281 (1978)
Ion Optics and Surface Analysis. Institut of Physics Conference Series 25.
Zeitschriftenartikel
7A, S. 807 - 814 (1978)
Progress in Secondary Ion Mass Spectrometry Instrumentation. Advances in Mass Spectrometry 26.
Zeitschriftenartikel
7A, S. 751 - 757 (1978)
Limits of Lateral Resolution in Ion Probe Microanalysis. Advances in Mass Spectrometry 27.
Zeitschriftenartikel
19, S. 327 - 334 (1976)
An Electronic Aperture for In-Depth Analysis of Solids with an Ion Microprobe. International Journal of Mass Spectrometry and Ion Physics 28.
Zeitschriftenartikel
54, S. 142 (1976)
Sekundaerionen - Massenspektrometrie. Fortschritte in der Mineralogie 29.
Zeitschriftenartikel
22, S. 203 - 207 (1976)
A Modified Cylindrical Condenser as Electrostatic Prism. International Journal of Mass Spectrometry and Ion Physics 30.
Zeitschriftenartikel
22, S. 237 - 246 (1976)
Study of an Iodine Discharge in a Duoplasmatron. International Journal of Mass Spectrometry and Ion Physics 31.
Zeitschriftenartikel
11, S. 103 - 112 (1976)
Cluster Induced Secondary Electron Emission. International Journal of Mass Spectrometry and Ion Physics 32.
Zeitschriftenartikel
8, S. 359 - 360 (1975)
Depth-Profiling of Cu-Ni Sandwich Samples by Secondary Ion Mass Spectrometry. Applied Physics 33.
Zeitschriftenartikel
8, S. 797 - 808 (1975)
Ion Probe Microanalysis. Journal of Physics. E 34.
Zeitschriftenartikel
12, 1, S. 385 - 391 (1975)
Secondary-Ion Mass Spectrometry and its Use in Depth Profiling. Journal of Vacuum Science and Technology 35.
Zeitschriftenartikel
15, S. 116 - 120 (1974)
Quadrupole Secondary Ion Mass Spectrometry Apparatus with Enhanced Transmission. International Journal of Mass Spectrometry and Ion Physics 36.
Zeitschriftenartikel
6, S. 535 - 540 (1974)
Static Mass Spectrometers with Axial Symmetry. Advances in Mass Spectrometry 37.
Zeitschriftenartikel
46, 1, S. 22A - 30A (1974)
Ion Microprobe Analysers: History and Outlook. Analytical Chemistry 38.
Zeitschriftenartikel
22, 11, S. 619 - 621 (1972)
A Coaxial Combined Electrostatic Objective and Anode Lens for Microprobe Mass Analysers. Vacuum 39.
Zeitschriftenartikel
12, S. 358 - 365 (1972)
Ionen-Mikrosonden-Analysatoren. Messtechnik 40.
Zeitschriftenartikel
80 (12), S. 358 - 365 (1972)
ION-MICROSCOPE ANALYZER. MESSTECHNIK