Wall Forum 2018

Vortragender: Karsten Schlüter

Dependence of Sputtering and Oxidation on the Crystal Orientation of Tungsten

Wall Forum
A method will be introduced to combine electron backscatter diffraction data from a scanning electron microscope and height profile data from a confocal laser scanning microscope. Oxidation and sputter experiments of tungsten were performed and results will be presented. [mehr]
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