Publikationen von E. Taglauer

Zeitschriftenartikel (163)

161.
Zeitschriftenartikel
Taglauer, E.; Heiland, W.: Investigation of the Chain Effect in the Scattering of Low Energy Noble Gas Ions from a Ni(110) Surface. Surface Science 33, S. 27 - 34 (1972)
162.
Zeitschriftenartikel
Taglauer, E.; Heiland, W.: Multiple Scattering of Low Energy Noble Gas Ions from a Nickel Single Crystal Surface. The Journal of Vacuum Science and Technology 9, S. 623 (1972)
163.
Zeitschriftenartikel
Blauth, E.W.; Draeger, W.M.; Kirschner, J.; Liebl, H.; Mueller, N.; Taglauer, E.: Experimental and Statistical Investigations on the Measurement of very Low Ion Currents in Mass Spectrometers. Journal of Vacuum Science and Technology 8, S. 384 - 387 (1970)

Buch (2)

164.
Buch
Langley, R.A.; Bohdansky, J.; Eckstein, W.; Roth, J.; Mioduszewski, P.; Taglauer, E.; Thomas, E.W.; Verbeek, H.; Wilson, K.L.: Data Compendium for Plasma-Surface Interactions. (1984)
165.
Buch
Taglauer, E.; Heiland, W.: Inelastic Particle-Surface Collisions. Springer, Berlin (1981)

Buchkapitel (21)

166.
Buchkapitel
Taglauer, E.: Low-energy Ion Scattering and Rutherford Backscattering. In: Surface Analysis - The Principal Techniques (Second Edition), S. 269 - 331 (Hg. Vickerman, J. C.; Gilmore, I. S.). Wiley, Chichester (2009)
167.
Buchkapitel
Knözinger, H.; Taglauer, E.: Spreading and Wetting. In: Handbook of Heterogeneous Catalysis, Vol. 1, S. 555 - 571 (Hg. Ertl, G.; Knözinger, H.; Schüth, F.; Weikamp, J.). Wiley-VCH, Weinheim (2008)
168.
Buchkapitel
Taglauer, E.: Surface Chemical Composition. In: Handbook of Heterogeneous Catalysis, Vol. 2, S. 1014 - 1029 (Hg. Ertl, G.; Knözinger, H.; Schüth, F.; Weitkamp, J.). Wiley-VCH, Weinheim (2008)
169.
Buchkapitel
Taglauer, E.: Low-energy Ion Scattering and Rutherford Backscattering. In: Surface Analysis - The Principal Techniques, S. 215 - 266 (Hg. Vickerman, J. C.; Gilmore, I. S.). Wiley, Chichester (2007)
170.
Buchkapitel
Günther, S.; Esch, F.; Gregoratti, L.; Marsi, M.; Kiskinova, M.; Schubert, U. A.; Grotz, P.; Knözinger, H.; Taglauer, E.; Schütz, E. et al.; Schaak, A.; Imbihl, R.: Spectromicroscopy of Catalytic Relevant Processes with Sub-Micron Resolution. In: Proceedings of the 6th International Conference on X-Ray Microscopy, Berkeley, 1999-08-01 to 1999-08-06, S. 219 - 224 (Hg. Meyer-Ilse, W.; Warwick, T.; Attwood, D.). AIP Press, Melville/NY (2000)
171.
Buchkapitel
Taglauer, E.; MacDonald, R.J.; Du Plessis, J.; Tagaluer, E.; Van Wyck, G.N.; Wandelt, K.R.: Surface Segregation and Preferential Sputtering of Binary Alloys. In: Surface Science - Principles and Current Applications, S. 136 - 145. Springer (1996)
172.
Buchkapitel
Taglauer, E.: Sputtering and surface science. In: Fundamental Processes in Sputtering of Atoms and Molecules, S. 643 - 657 (1993)
173.
Buchkapitel
Taglauer, E.; Howe, R.F.; Knoezinger, H.; Lamb, R.N.; Wandelt, K.: Investigation of Catalyst Systems by Means of Low-Energy Ion Scattering. In: Surface Science: Principles and Applications, Bd. 73, S. 264 - 278. Springer (1993)
174.
Buchkapitel
Brakel, R.; Burhenn, R.; Elsner, A.; Grigull, P.; Hacker, H.; Kondo, K.; Sardei, F.; Schneider, U.; Weller, A.; Wolff, H. et al.; Behrisch, R.; Hildebrandt, D.; Renner, H.; Roth, J.; Taglauer, E.; W7-AS-Team; ECRH-Group; NI-Group: Impurity Behaviour in W7-AS Plasmas under Different Wall Conditions. In: W7-AS Contributions to the 18th European Conference on Controlled Fusion and Plasma Heating, (Berlin, June 3 - 7, 1991). Max-Planck-Institut für Plasmaphysik, Garching(DE), Garching (1991)
175.
Buchkapitel
Taglauer, E.; Czanderna, A.W.; Hercules, D. M.: Ion Scattering Spectroscopy. In: Ion Spectroscopies for Surface Analysis, Bd. 2, S. 363 - 416. Plenum Publ. (1991)
176.
Buchkapitel
Taglauer, E.; Frey, H.; Heiland, W.; Kienel, K.: Physikalische Grundlagen moderner Methoden der Oberflaechenanalyse. In: Duennschichttechnologie, S. 314 - 339 (1987)
177.
Buchkapitel
Taglauer, E.; LeLay, G.; Derrien, J.; Boccara, N.: Surface Characterization by Low-Energy Ion Scattering. In: Semiconductor Interfaces: Formation and Properties, S. 150 - 159 (1987)
178.
Buchkapitel
Baretzky, B.; Kiriakidis, G.; Taglauer, E.: Preferential Sputtering of Tantalum Oxide: Reemission of Helium and Transient Effects in the Altered Layer. In: Erosion and Growth of Solids Stimulated by Atom and Ion Beams, Bd. 112, S. 146 - 150. Nijhoff (1986)
179.
Buchkapitel
Heiland, W.; Park, R.L.; Taglauer, E.; Lagally, M.: Ion Scattering and Secondary Ion Mass Spectroscopy. In: Methods of Experimental Physics, S. 299. Academic Press (1985)
180.
Buchkapitel
Tolk, N.H.; Brenig, E.; Haglund, R.F.; Menzel, D.; Taglauer, E.; et al.: Electronically Induced Desorption of Neutral Atoms Observed by Optical Techniques. In: Desorption Induced by Electronic Transitions DIET II, S. 152. Springer (1985)
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