Publikationen von E. Taglauer

Heiland, W.; Taglauer, E.: The Backscattering of Low Energy Ions and Surface Structure. Surface Science 68, S. 96 - 107 (1977)

Taglauer, E.; Marin, G.; Heiland, W.: A Contribution to the Investigation of Ion Impact Desorption by Ion Scattering. Applied Physics 13, S. 47 - 49 (1977)

Taglauer, E.; Marin, G.; Heiland, W.; Beitat, U.: Study of the Sputtering of Adsorbates by Low Energy Ions ( O on Ni ). Surface Science 63, S. 507 - 513 (1977)

Heiland, W.; Taglauer, E.: Low Energy Ion Scattering: Elastic and Inelastic Effects. Nuclear Instruments and Methods 132, S. 535 - 545 (1976)

Heiland, W.; Taglauer, E.: Multiple Scattering of Low Energy Rare Gas Ions: A Comparison of Experiment and Computer Simulation. Nuclear Instruments and Methods 132, S. 655 - 660 (1976)

Taglauer, E.; Beitat, U.; Marin, G.; Heiland, W.: Sputtering of Absorbed Layers by Ion Bombardement. Journal of Nuclear Materials 63, S. 193 - 198 (1976)

Taglauer, E.; Heiland, W.: Surface Analysis with Low Energy Ion Scattering. Applied Physics 9, S. 261 - 275 (1976)

Heiland, W.; Iberl, F.; Taglauer, E.: Oxygen Adsorption on 110_Silver. Surface Science 53, S. 383 - 392 (1975)

Heiland, W.; Taglauer, E.: Abstract: Surface Analytical Studies Using Ion Scattering Spectrometry, Auger Electron Spectroscopy and Secondary Ion Mass Spectrometry. The Journal of Vacuum Science and Technology 12, S. 352 (1975)

Taglauer, E.; Heiland, W.: Low Energy Ion Scattering and Auger Electron Spectroscopy Studies of Clean Nickel Surfaces and Absorbed Layers. Surface Science 47, S. 234 - 243 (1975)

Taglauer, E.; Melchior, W.; Schuster, F.; Heiland, W.: SORBAS: Eine Apparatur zur Untersuchung der Oberflaechenstreuung von Ionen im Energiebereich 100_eV - 2000_eV. Journal of Physics. E 8, S. 768 - 772 (1975)

Buende, R.; Daenner, W.; Hofer, W.; Huels, M.; Poehlchen, R.; Soell, M.; Taglauer, E.; Weichselgartner, H.: Aspekte der Energieversorgung mit Fusionsreaktoren. Brennstoff - Waerme - Kraft Jg. 26, Nr. 11, S. 467 - 472 (1974)

Coburn, J.W.; Taglauer, E.; Kay, E.: Glow-Discharge Mass Spectrometry-Technique for Determining Elemental Composition Profiles in Solids. Journal of Applied Physics 45, 5, S. 1779 - 1786 (1974)

Grundner, M.; Heiland, W.; Taglauer, E.: Direct Comparison of Ion Scattering and Secondary Ion Emission as Tools for Analysis of Metal Surfaces. Applied Physics 4, S. 243 - 248 (1974)

Taglauer, E.; Heiland, W.: Direct Comparison of Low-Energy Ion Backscattering with Auger Electron Spectroscopy in the Analysis of S Adsorbed on Ni. Applied Physics Letters 24, S. 437 - 439 (1974)

Ertl, K.; Taglauer, E.: Partial Pressure Analysis Using a Two-Chamber Gauge Together with an Ion-Electron Converter. Journal of Vacuum Science and Technology 10, 1, S. 204 - 207 (1973)

Kirschner, J.; Kurz, N.; Taglauer, E.: Comment on: Gas-Pressure Dependence of Pre-Breakdown Conduction in High Vacuum. Physica 66, S. 416 - 418 (1973)

Heiland, W.; Schaeffler, H.G.; Taglauer, E.: Energy Distributions of Low-Energy Noble Gas Ions Backscattered from a Single-Crystal Nickel Surface. Surface Science 35, S. 381 - 392 (1972)

Heiland, W.; Taglauer, E.: Investigation of Surface Topography of Oxygen on Nickel Single Crystals by Helium Ion Backscattering. Journal of Vacuum Science and Technology 251, S. 620 - 623 (1972)

Taglauer, E.; Heiland, W.: Investigation of the Chain Effect in the Scattering of Low Energy Noble Gas Ions from a Ni(110) Surface. Surface Science 33, S. 27 - 34 (1972)