Publikationen von H LIEBL
Alle Typen
Zeitschriftenartikel (44)
41.
Zeitschriftenartikel
22 (11), S. 619 - 621 (1972)
COAXIAL COMBINED ELECTROSTATIC OBJECTIVE AND ANODE LENS FOR MICROPROBE MASS ANALYZERS. VACUUM 42.
Zeitschriftenartikel
9, 1, S. 492 - 495 (1972)
Double Chamber Partial Pressure Gauge. Journal of Vacuum Science and Technology 43.
Zeitschriftenartikel
6, S. 401 - 412 (1971)
Design of a Combined Ion and Electron Microprobe Apparatus. International Journal of Mass Spectrometry and Ion Physics 44.
Zeitschriftenartikel
8, S. 384 - 387 (1970)
Experimental and Statistical Investigations on the Measurement of very Low Ion Currents in Mass Spectrometers. Journal of Vacuum Science and Technology Buchkapitel (4)
45.
Buchkapitel
Ion Gun Systems for Submicron SIMS. In: Secondary Ion Mass Spectrometry SIMS IV, S. 114 (1984)
46.
Buchkapitel
Vol. 2, S. 659 - 664 (1976)
Sputtering of Thin Films in an Ion Microprobe. In: Ion Beam Surface Layer Analysis, Bd. 47.
Buchkapitel
Bd. 427, S. 1 (1975)
The Ion Microprobe-Instrumentation and Techniques. In: Secondary Ion Mass Spectrometry, Bd. 48.
Buchkapitel
The Ion Microprobe. In: Modern Techniques in Physiological Sciences, S. 361 - 378 (1973)
Konferenzbeitrag (9)
49.
Konferenzbeitrag
Low-Energy Electron Microscope of Novel Design. In: Proc. of the 12. International Congress for Electron Microscopy, S. 352 - 353. Proc. of the 12. International Congress for Electron Microscopy, Seattle, WA(US), 01. Januar 1990. San Francisco Press Inc. (1990)
50.
Konferenzbeitrag
Compact Cs+ Ion Microsource. In: Secondary Ion Mass Spectrometry. Proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry, S. 883 - 886 (Hg. Benninghoven, A.). 7th Secondary Ion Mass Spectrometry (SIMDVII), Monterey, CA (US), 03. September 1989 - 08. September 1989. Wiley, Chichester (1990)
51.
Konferenzbeitrag
Performance Evaluation of a Novel Type of Low-Energy Electron Microscope. In: Proc. of the 12. International Congress for Electron Microscopy, S. 354 - 355. Proc. of the 12. International Congress for Electron Microscopy, Seattle, WA(US), 01. Januar 1990. San Francisco Press Inc. (1990)
52.
Konferenzbeitrag
On a Combined Electrostatic Objective and Emission Lens for Charged Particle of Oposite or Equal Polarity: International Symposium. In: Electron Optics, S. 154 - 161. Electron Optics, Beijing (CN), 01. Januar 1987. (1987)
53.
Konferenzbeitrag
New Trends in Instrumentation. In: Secondary Ion Mass Spectrometry, S. 205 - 210. Secondary Ion Mass Spectrometry, Osaka (JP), 22. Oktober 1978 - 28. Oktober 1978. (1979)
54.
Konferenzbeitrag
Depth Analysis of Thin Films with an Ion Microprobe. In: 148. Meeting of the Electrochemical Society, S. 243. 148. Meeting of the Electrochemical Society, Princeton, NJ(US), 05. Oktober 1975 - 10. Oktober 1975. (1975)
55.
Konferenzbeitrag
Neue Tendenzen in der Geraeteentwicklung von Ionensonden und Elektronensonden. In: Mikrosonde, S. 189 - 198. Mikrosonde, Berlin (DE). (1975)
56.
Konferenzbeitrag
A Combined Ion and Electron Microprobe. In: Mass Spectrometry, S. 433 - 435. Mass Spectrometry, Brussel (BE). (1970)
57.
Konferenzbeitrag
Mattauch-Herzog-Type Mass Spectrographs with Independent Adjustment of Aperture and Energy Bandwidth. In: Mass Spectrography, S. 188 - 193. Mass Spectrography, Kyoto (JP), 08. September 1969 - 12. September 1969. (1969)
Bericht (1)
58.
Bericht
Cs+ ion source for secondary ion mass spectrometry. Max-Planck-Institut für Plasmaphysik, Garching (1981)