Publikationen von H. Liebl
Alle Typen
Zeitschriftenartikel (44)
2007
Zeitschriftenartikel
78, 083903 (2007)
Inverse photoemission with energy resolution better than 200 meV. Review of Scientific Instruments 1991
Zeitschriftenartikel
36, S. 91 - 98 (1991)
Low-Energy Electron Microscope of Novel Design. Ultramicroscopy 1990
Zeitschriftenartikel
85, 2, S. 87 (1990)
On the Image Aberration of an Accelerating Central Field. Optik 1989
Zeitschriftenartikel
11, S. 101 - 151 (1989)
Ion Probe Microscopy. Advances in Optical and Electron Microscopy
Zeitschriftenartikel
83, 4, S. 129 - 133 (1989)
The Image Aberration Caused by the Acceleration Field Between Concentric Spherical Electrodes. Optik 1988
Zeitschriftenartikel
59, 9, S. 1933 - 1940 (1988)
High-Performance GaAs Polarized Electron Source for Use in Inverse Photoemission Spectroscopy. Review of Scientific Instruments
Zeitschriftenartikel
Bd. 80, Nr. 1, S. 4 - 8 (1988)
On the Image Aberration of the Uniform Acceleration Field of an Emission Lens. Optik
Zeitschriftenartikel
59, 10, S. 2174 - 2176 (1988)
Cs_exp.+ Ion Microsource. Review of Scientific Instruments 1987
Zeitschriftenartikel
258, S. 323 - 326 (1987)
A Compact Double-Focusing Mass Spectrometer. Nuclear Instruments and Methdos in Physics Research. A
Zeitschriftenartikel
76, 4, S. 170 - 172 (1987)
Transfer Matrix for the Trajectories of Charged Particles Between Concentric, Spherical, Equipotential Surfaces. Optik
Zeitschriftenartikel
58, 10, S. 1830 - 1832 (1987)
Deceleration Ion Optical Systems for Sputtering Measurements between 50 eV as Function of Angle of Incidence. Review of Scientific Instruments 1986
Zeitschriftenartikel
3, S. 793 - 798 (1986)
Ion Optics of Submicron Ion Beams. Scanning Electron Microscopy 1984
Zeitschriftenartikel
11, S. 519 (1984)
High-Resolution Scanning Ion Microscopy and Secondary-Ion Mass Spectrometry: Problems and Solutions. Scanning Electron Microscopy 1983
Zeitschriftenartikel
46, S. 511 (1983)
Combined Electrostatic Objective and Emission Lenses for Microcharacterization of Surfaces. International Journal of Mass Spectrometry and Ion Physics
Zeitschriftenartikel
33, S. 525 (1983)
Ion Optics of Ion Microprobe Instruments. Vacuum
Zeitschriftenartikel
314, S. 244 (1983)
Grenzen der Ortsaufloesung bei SIMS. Fresenius Zeitschrift fuer Analytische Chemie 1981
Zeitschriftenartikel
58, S. 433 (1981)
Comment on ' An Analysis of Some Solution Techniques for Electrostatic Coaxial Lenses '. Optik
Zeitschriftenartikel
187, S. 143 (1981)
Beam Optics in Secondary Ion Mass Spectrometry. Nuclear Instruments and Methods in Physics Research
Zeitschriftenartikel
191, S. 183 (1981)
Optimum Sample Utilization in Secondary Ion Mass Spectrometry. Nuclear Instruments and Methods in Physics Research 1980
Zeitschriftenartikel
3, S. 79 (1980)
SIMS Instrumentation and Imaging Techniques. Scanning