Publikationen von H. Liebl

Budke, M.; Renken, V.; Liebl, H.; Rangelov, G.; Donath, M.: Inverse photoemission with energy resolution better than 200 meV. Review of Scientific Instruments 78, 083903 (2007)

Liebl, H.; Senftinger, B.: Low-Energy Electron Microscope of Novel Design. Ultramicroscopy 36, S. 91 - 98 (1991)

Liebl, H.: On the Image Aberration of an Accelerating Central Field. Optik 85, 2, S. 87 (1990)

Liebl, H.: Ion Probe Microscopy. Advances in Optical and Electron Microscopy 11, S. 101 - 151 (1989)

Liebl, H.: The Image Aberration Caused by the Acceleration Field Between Concentric Spherical Electrodes. Optik 83, 4, S. 129 - 133 (1989)

Kolac, U.; Donath, M.; Ertl, K.; Liebl, H.; Dose, V.: High-Performance GaAs Polarized Electron Source for Use in Inverse Photoemission Spectroscopy. Review of Scientific Instruments 59, 9, S. 1933 - 1940 (1988)

Liebl, H.: On the Image Aberration of the Uniform Acceleration Field of an Emission Lens. Optik Bd. 80, Nr. 1, S. 4 - 8 (1988)

Liebl, H.; Senftinger, B.: Cs_exp.+ Ion Microsource. Review of Scientific Instruments 59, 10, S. 2174 - 2176 (1988)

Liebl, H.: A Compact Double-Focusing Mass Spectrometer. Nuclear Instruments and Methdos in Physics Research. A 258, S. 323 - 326 (1987)

Liebl, H.: Transfer Matrix for the Trajectories of Charged Particles Between Concentric, Spherical, Equipotential Surfaces. Optik 76, 4, S. 170 - 172 (1987)

Liebl, H.; Bohdansky, J.; Roth, J.; Dose, V.: Deceleration Ion Optical Systems for Sputtering Measurements between 50 eV as Function of Angle of Incidence. Review of Scientific Instruments 58, 10, S. 1830 - 1832 (1987)

Liebl, H.: Ion Optics of Submicron Ion Beams. Scanning Electron Microscopy 3, S. 793 - 798 (1986)

Liebl, H.: High-Resolution Scanning Ion Microscopy and Secondary-Ion Mass Spectrometry: Problems and Solutions. Scanning Electron Microscopy 11, S. 519 (1984)

Liebl, H.: Combined Electrostatic Objective and Emission Lenses for Microcharacterization of Surfaces. International Journal of Mass Spectrometry and Ion Physics 46, S. 511 (1983)

Liebl, H.: Ion Optics of Ion Microprobe Instruments. Vacuum 33, S. 525 (1983)

Liebl, H.: Grenzen der Ortsaufloesung bei SIMS. Fresenius Zeitschrift fuer Analytische Chemie 314, S. 244 (1983)

Liebl, H.: Comment on ' An Analysis of Some Solution Techniques for Electrostatic Coaxial Lenses '. Optik 58, S. 433 (1981)

Liebl, H.: Beam Optics in Secondary Ion Mass Spectrometry. Nuclear Instruments and Methods in Physics Research 187, S. 143 (1981)

Liebl, H.: Optimum Sample Utilization in Secondary Ion Mass Spectrometry. Nuclear Instruments and Methods in Physics Research 191, S. 183 (1981)

Liebl, H.: SIMS Instrumentation and Imaging Techniques. Scanning 3, S. 79 (1980)