Publikationen von H LIEBL
Alle Typen
Zeitschriftenartikel (44)
1972
Zeitschriftenartikel
22 (11), S. 619 - 621 (1972)
COAXIAL COMBINED ELECTROSTATIC OBJECTIVE AND ANODE LENS FOR MICROPROBE MASS ANALYZERS. VACUUM
Zeitschriftenartikel
9, 1, S. 492 - 495 (1972)
Double Chamber Partial Pressure Gauge. Journal of Vacuum Science and Technology 1971
Zeitschriftenartikel
6, S. 401 - 412 (1971)
Design of a Combined Ion and Electron Microprobe Apparatus. International Journal of Mass Spectrometry and Ion Physics 1970
Zeitschriftenartikel
8, S. 384 - 387 (1970)
Experimental and Statistical Investigations on the Measurement of very Low Ion Currents in Mass Spectrometers. Journal of Vacuum Science and Technology Buchkapitel (4)
1984
Buchkapitel
Ion Gun Systems for Submicron SIMS. In: Secondary Ion Mass Spectrometry SIMS IV, S. 114 (1984)
1976
Buchkapitel
Vol. 2, S. 659 - 664 (1976)
Sputtering of Thin Films in an Ion Microprobe. In: Ion Beam Surface Layer Analysis, Bd. 1975
Buchkapitel
Bd. 427, S. 1 (1975)
The Ion Microprobe-Instrumentation and Techniques. In: Secondary Ion Mass Spectrometry, Bd. 1973
Buchkapitel
The Ion Microprobe. In: Modern Techniques in Physiological Sciences, S. 361 - 378 (1973)
Konferenzbeitrag (9)
1990
Konferenzbeitrag
Low-Energy Electron Microscope of Novel Design. In: Proc. of the 12. International Congress for Electron Microscopy, S. 352 - 353. Proc. of the 12. International Congress for Electron Microscopy, Seattle, WA(US), 01. Januar 1990. San Francisco Press Inc. (1990)
Konferenzbeitrag
Compact Cs+ Ion Microsource. In: Secondary Ion Mass Spectrometry. Proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry, S. 883 - 886 (Hg. Benninghoven, A.). 7th Secondary Ion Mass Spectrometry (SIMDVII), Monterey, CA (US), 03. September 1989 - 08. September 1989. Wiley, Chichester (1990)
Konferenzbeitrag
Performance Evaluation of a Novel Type of Low-Energy Electron Microscope. In: Proc. of the 12. International Congress for Electron Microscopy, S. 354 - 355. Proc. of the 12. International Congress for Electron Microscopy, Seattle, WA(US), 01. Januar 1990. San Francisco Press Inc. (1990)
1987
Konferenzbeitrag
On a Combined Electrostatic Objective and Emission Lens for Charged Particle of Oposite or Equal Polarity: International Symposium. In: Electron Optics, S. 154 - 161. Electron Optics, Beijing (CN), 01. Januar 1987. (1987)
1979
Konferenzbeitrag
New Trends in Instrumentation. In: Secondary Ion Mass Spectrometry, S. 205 - 210. Secondary Ion Mass Spectrometry, Osaka (JP), 22. Oktober 1978 - 28. Oktober 1978. (1979)
1975
Konferenzbeitrag
Depth Analysis of Thin Films with an Ion Microprobe. In: 148. Meeting of the Electrochemical Society, S. 243. 148. Meeting of the Electrochemical Society, Princeton, NJ(US), 05. Oktober 1975 - 10. Oktober 1975. (1975)
Konferenzbeitrag
Neue Tendenzen in der Geraeteentwicklung von Ionensonden und Elektronensonden. In: Mikrosonde, S. 189 - 198. Mikrosonde, Berlin (DE). (1975)
1970
Konferenzbeitrag
A Combined Ion and Electron Microprobe. In: Mass Spectrometry, S. 433 - 435. Mass Spectrometry, Brussel (BE). (1970)
1969
Konferenzbeitrag
Mattauch-Herzog-Type Mass Spectrographs with Independent Adjustment of Aperture and Energy Bandwidth. In: Mass Spectrography, S. 188 - 193. Mass Spectrography, Kyoto (JP), 08. September 1969 - 12. September 1969. (1969)
Bericht (1)
1981
Bericht
Cs+ ion source for secondary ion mass spectrometry. Max-Planck-Institut für Plasmaphysik, Garching (1981)