The blistering and near-surface deuterium retention of Y
2O
3-doped W and two different pure W grades were studied after exposure to deuterium (D) plasma at elevated temperatures (370, 450 and 570 K) in PlaQ. The research shows blistering and deuterium retention were strongly dependent on the implantation temperature. In addition, blistering was sensitively influenced by the used tungsten grade, although the total amount of retained D measured by nuclear reaction analysis was comparable. Among the three different investigated tungsten grades, Y
2O
3-doped W exhibited the lowest degree of surface modification despite a comparable total D retention.
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